Thursday, March 15, 2007
9/11 MAJOR DEFEAT
Z. Guo, New Jersey Institute of Technology, G. Jiang, NEC Laboratories America, H. Chen, NEC Laboratories America and K. Yoshihira, NEC Laboratories America, "Tracking Probabilistic Correlation of Monitoring Data for Fault Detection in Complex Systems", Proceedings of the International Conference on Dependable Systems and Networks - DSN 2006 pp. 259-268, 2006
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